Digital Image Correlation (DIC)

VIC-3D HS

by Correlated Solutions

Correlated Solutions
VIC-3D HS

The VIC-3D™ HS Vibration Analysis DIC System by Correlated Solutions, Inc. is a new addition to the VIC-3D™ product line of measurement solutions. This Turn-Key High-Speed Digital Image Correlation system can measure full-field, three-axes displacements during vibration events. Since the acquisition time is very short, the system is capable of measuring operational deflection shapes during transient events as well as the impulse response to an impact. The system achieves resolution in the nanometer range and provides full-field three-axis displacement as well as strain data.

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Technical Specifications

ParameterTypical Range
Measurement TypeFull-field 3D shape, displacement, velocity, strain
Displacement ResolutionNanometer range
Strain Range0.005% to >2000%
Strain Resolution10 µε
Max Acquisition RateUp to 500,000 fps (standard); up to 5 MHz (ultra high-speed)
Max ResolutionUp to 4 megapixels
Measurement Areamm² to m²

Key Specifications

  • •Full-field 3D measurements: shape, displacements, velocities, strains
  • •Displacement resolution in the nanometer range
  • •Strain measurement resolution: 10 µε
  • •Strain measurement range: 0.005% to >2000%
  • •Standard systems: up to 500,000 fps, up to 4 megapixels
  • •Ultra high-speed systems: up to 5 MHz
  • •Measurement area: mm² to m²

Key Features

  • •Turn-key high-speed DIC system with VIC-Snap HS acquisition software
  • •Non-contacting measurement — eliminates mechanical interaction with sample
  • •Full-field measurements identify critical points and unrecognized hotspots
  • •Camera Disturbance Correction included
  • •Multi-System Stitching (requires multiple camera systems)
  • •Marker Tracking included
  • •iris data visualization engine — creates plots up to 4K resolution

Software & Integration

  • •VIC-3D
  • •VIC-Snap HS

Applications

  • •High-speed vibration analysis
  • •Dynamic compression testing
  • •Ballistics and impact testing
  • •Transient event analysis
  • •Operational deflection shape measurement

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